Last edited by Mezirisar
Friday, July 24, 2020 | History

8 edition of Surface analysis of polymers by XPS and static SIMS found in the catalog.

Surface analysis of polymers by XPS and static SIMS

by Briggs, D.

  • 359 Want to read
  • 9 Currently reading

Published by Cambridge University Press in Cambridge, U.K, New York .
Written in English

    Subjects:
  • Polymers -- Surfaces -- Analysis.,
  • X-ray spectroscopy.,
  • Secondary ion mass spectrometry.

  • Edition Notes

    Includes bibliographical references (p. 190-193) and index.

    StatementD. Briggs.
    SeriesCambridge solid state science series
    Classifications
    LC ClassificationsQD381.9.S97 B75 1998
    The Physical Object
    Paginationxiv, 198 p. :
    Number of Pages198
    ID Numbers
    Open LibraryOL679549M
    ISBN 100521352223
    LC Control Number97026059

    XPS was used to investigate trace metal adsorption on calcite surface because of its high surface sensitivity. 8 The chemical and morphological behavior of the calcite surfaces during exposure to air were studied with a combination of TOF-SIMS and scanning force microscopy (SFM). 12 The dissolution behavior of CaCO 3 in the presence of a Cited by: and Structural Analysis (Wiley Series on Mass Spectrometry) Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series) Palpation Techniques: Surface Anatomy for Physical Therapists Surface Treatment Workshop: Explore 45 Mixed-Media Techniques The Art of Polymer Clay Creative Surface Effects: Techniques and.

    Rajiv Kohli, in Developments in Surface Contamination and Cleaning: Applications of Cleaning Techniques, Surface Analyses. Surface analysis techniques, such as Auger electron spectroscopy (AES), time-of-flight secondary ion mass spectrometry (TOF-SIMS) and x-ray photoelectron spectroscopy (XPS), can provide detailed information on the chemical structure of surface . David Briggs – in Memoriam. Surface analysis of polymers by XPS and static SIMS. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface .

    SIMS SSIMS – static SIMS „small quantity“ (analysis of surface molecules DSIMS – dynamic SIMS – „large quantity“ – measurement of concentration in-depth profiles Comment.: imaging of area distribution of elements on the surface – in both modes. Surface analysis of polymers by XPS and static SIMS / by: Briggs, D. (David), Published: () An introduction to surface analysis by XPS and AES / by: Watts, John F. Published: ().


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Surface analysis of polymers by XPS and static SIMS by Briggs, D. Download PDF EPUB FB2

XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and by: XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving.

The author describes the techniques and applications of XPS and SSIMS. Surface Analysis of Polymers by XPS and Static SIMS.

D Briggs, Cambridge University Press, Cambridge, pp. xiv+, price £ ISBN 0‐‐‐3. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving.

In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving.

In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. Polymer surface pretreatment and modification 4 Depth scales associated with surface behaviour 5 Requirements for polymer surface analysis techniques Brief history of XPS 7 Brief history of SIMS 11 Chapter 2 XPS 14 Instrumentation 14 Physical basis 27 Chapter 3 Information from polymer XPS 47 Sample charging © Cambridge University Press Cambridge University Press X - Surface Analysis of Polymers by XPS and Static SIMS D.

Briggs. Abstract. X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SIMS) were used to identify and quantify different isomeric butyl methacrylate polymers. The samples examined were normal- iso- and tert - butyl methacrylate (n - i - and t -BuMA) homopolymers and two n / t -BuMA random copolymers.

The surface analysis of polymers can now rely on many spectroscopic techniques [], some of them well established, such as X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS), and others at a less mature level but which are quite promising, such as ion scattering spectro- metry (ISS), high resolution Cited by: [ISBN ] You will probably be familiar with the book by G.

Beamson and D. Briggs entitled “High Resolution XPS of Organic Polymers – The Scienta ESCA Database“, published by Wiley in This popular and successful book went out of. Surface Chemical Analysis by XPS and SIMS An end to one’s means.

• tendency to avoid surface analysis because it is too expensive • commercial charges up to £ per day • EPSRC Mid-range XPS facility at Newcastle – ‘NEXUS’ free to EPSRC fundable researchers • SEAL Ion Beam Tools may need to make a small charge to cover running costs.

XPS Polymer Database The SurfaceSpectra product is a virtual treasure trove of "experience" and "wisdom" that supports surface analysis. SurfaceSpectra provides a knowledge system to support practical analysis mainly by way of a static SIMS database and polymer XPS spectrum database.

SSIMS [ToF-SIMS] SSIMS is a method oriented to detect and analyse molecules on the surface of samples analysis of molecule species [chemical structure and mass of the polymer's repeating units type of monomer non-quantitative surface analysis [semi-quantitative surface analysis].

Surface analysis of polymers by XPS and static SIMS. [D Briggs; Cambridge University Press.] -- This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a.

Cambridge University Press, Cambridge, Polymer surfaces are of scientià c interest and technological importance. X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) are the two most versatile techniques for the study of polymer surfaces, their complementary characteristics well recognized by surface analysts and manufacturers.

ToF-SIMS: Materials Analysis by Mass Spectrometry. Edited by John C. Vickerman and David Briggs. The only book wholly dedicated to time-of-flight SIMS.

Available as a hardbacked, printed book or electronic datafiles, downloadable chapter-by-chapter from the internet. 27 chapters covering the fundamentals, interpretation and applications of ToF. Surface Analysis of Polymers by XPS and Static SIMS Cambridge Solid State Science Series Read Online.

Biabiawi. PDF Download Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science. Iwyoln. Book CVD Polymers: Fabrication of Organic Surfaces and Devices Download Full Ebook. Ginalfoki.

Get this from a library. Surface analysis of polymers by XPS and static SIMS. [D Briggs]. materials Review Surface Characterization of Polymer Blends by XPS and ToF-SIMS Chi Ming Chan 1,2,* and Lu-Tao Weng 2,3 1 Division of Environment, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China 2 Department of Chemical and Biomolecular Engineering, Hong Kong University of Science and Technology, Clear Water Cited by: 6.

Surface Analytical Techniques (XPS, Auger, SIMS and RBS) Jerry Hunter, Ph. Analytical Methods. Electron Spectroscopy e-e-Auger Practical Surface Analysis 2nd EditionJohn Wiley & Sons (Chichester)p. XPS of Polymers Database ed: G. Beamson and D. Briggs. Spectral Features in XPS.

Surface Analysis by Auger and X-ray Photoelectron Spectroscopy The SurfaceSpectra product is a virtual treasure trove of "experience" and "wisdom" that supports surface analysis. SurfaceSpectra provides knowledge system to support practical analysis mainly by way of a static SIMS database and polymer XPS spectrum database.This book is an excellent resource for the surface analyst that works with organic and polymeric materials.

The treatment of fundamentals and hardware is adequate and appropriate. There are many examples given for polymeric and additive systems, but one would wish for similar treatment for more systems.5/5.Surface studies of halloysite nanotubes by XPS and ToF-SIMS Surface analysis of polymers by XPS and static SIMS.

as the two most powerful techniques for polymer surface chemical analysis.